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Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range

机译:分析在宽温度范围内au / Ni / n-GaN肖特基接触的电流电压测量

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摘要

Current-voltage characteristics of Au/Ni/n-GaN Schottky contacts have been measured in the60-320 K temperature range. The zero bias barrier height, bo  and ideality factor, n have beenstudied as a function of temperature. The sharp increase in ideality factor at low temperatureshas been explained as an effect of thermionic field emission. The deviation of thecharacteristics from the ideal thermionic behaviour are more pronounced with a decrease intemperature, in which the results obtained indicate the presence of other current transportmechanisms in the 60-280 K temperature range and the dominance of pure thermionicemission current at 300 K. The increase in barrier height with increasing temperature hasbeen explained as an effect of barrier inhomogeneities.
机译:已经在60-320 K的温度范围内测量了Au / Ni / n-GaN肖特基接触的电流-电压特性。已经研究了零偏压势垒高度bo和理想因子n作为温度的函数。低温下理想因子的急剧增加被解释为热电子场发射的影响。随着温度的降低,特性与理想热电子行为的偏差更加明显,其中获得的结果表明在60-280 K的温度范围内还存在其他电流传输机制,并且在300 K时纯热电子发射电流占主导地位。随着温度的升高,势垒高度的变化被解释为势垒不均匀性的影响。

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